Probe testing is a specialized tool used for electrical testing of electronic components, integrated circuits (ICs), printed circuit boards (PCBs), etc. It typically consists of a base, multiple probes, and a connector. The part of the probe that makes contact with the component being tested is called the tip or point, which can be made from various materials such as tungsten, copper, or gold. The tip is designed to make contact with the pads or leads of the component, and by conducting electrical current through them, it can detect the electrical parameters of the component, such as resistance, capacitance, inductance, etc.