Probe testing is a specialized tool used for electrical testing of electronic components, integrated circuits (ICs), printed circuit boards (PCBs), etc. It typically consists of a base, multiple probes, and a connector. The part of the probe that makes contact with the component being tested is called the tip or point, which can be made from various materials such as tungsten, copper, or gold. The probe tip is designed to make good electrical contact with the pads or leads of the component under test, allowing the flow of electrical current to be measured. This is used to test various electrical parameters of the component, such as resistance, capacitance, inductance, etc.